Issued Patents 2016
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9453873 | Non-planar field effect transistor test structure and lateral dielectric breakdown testing method | Fen Chen, Kevin Kolvenbach, Michael A. Shinosky | 2016-09-27 |
RD
Roger A. Dufresne
Overall (2016): #249,989 of 481,213Top 55%
1
Patents 2016