AK

Antoine Gaston Marie Kiers

AB Asml Netherlands B.V.: 3 patents #51 of 377Top 15%
Overall (2011): #53,789 of 364,097Top 15%
3
Patents 2011

Issued Patents 2011

Showing 1–3 of 3 patents

Patent #TitleCo-InventorsDate
8054467 Method and apparatus for angular-resolved spectroscopic lithography characterization Arie Jeffrey Den Boef, Arno Jan Bleeker, Youri Johannes Laurentius Maria Van Dommelen, Mircea Dusa, Paul Frank Luehrmann +4 more 2011-11-08
7916927 Inspection method and apparatus, lithographic apparatus, lithographic processing cell and device manufacturing method Hugo Augustinus Joseph Cramer, Durk Oeds Van Der Ploeg, Goce Naumoski, Roland Mark Van Weel 2011-03-29
7911612 Inspection method and apparatus, lithographic apparatus, lithographic processing cell and device manufacturing method Arie Jeffrey Den Boef, Maurits Van Der Schaar 2011-03-22