Issued Patents 2005
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6956644 | Systems and methods for a wafer inspection system using multiple angles and multiple wavelength illumination | Steve Biellak, Stanley Stokowski | 2005-10-18 |
| 6922236 | Systems and methods for simultaneous or sequential multi-perspective specimen defect inspection | Stan Stokowski, Steven Biellak, Jamie M. Sullivan, Keith Wells, Mehrdad Nikoonahad | 2005-07-26 |
| 6891611 | Sample inspection system | Stanley Stokowski, Guoheng Zhao | 2005-05-10 |
| 6862096 | Defect detection system | Jeffrey Rzepiela, Carl Treadwell, Andrew Zeng, Robert W. Fiordalice | 2005-03-01 |