Issued Patents 2005
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6922236 | Systems and methods for simultaneous or sequential multi-perspective specimen defect inspection | Mehdi Vaez-Iravani, Stan Stokowski, Steven Biellak, Keith Wells, Mehrdad Nikoonahad | 2005-07-26 |