Issued Patents 2005
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6922236 | Systems and methods for simultaneous or sequential multi-perspective specimen defect inspection | Mehdi Vaez-Iravani, Stan Stokowski, Steven Biellak, Jamie M. Sullivan, Mehrdad Nikoonahad | 2005-07-26 |
| 6888627 | Optical scanning system for surface inspection | Brian C. Leslie, Mehrdad Nikoonahad | 2005-05-03 |