Issued Patents 2005
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6922236 | Systems and methods for simultaneous or sequential multi-perspective specimen defect inspection | Mehdi Vaez-Iravani, Steven Biellak, Jamie M. Sullivan, Keith Wells, Mehrdad Nikoonahad | 2005-07-26 |
| 6844927 | Apparatus and methods for removing optical abberations during an optical inspection | Zain Saidin | 2005-01-18 |