Issued Patents 2005
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6956644 | Systems and methods for a wafer inspection system using multiple angles and multiple wavelength illumination | Steve Biellak, Mehdi Vaez-Iravani | 2005-10-18 |
| 6891611 | Sample inspection system | Mehdi Vaez-Iravani, Guoheng Zhao | 2005-05-10 |