Issued Patents 2005
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6956644 | Systems and methods for a wafer inspection system using multiple angles and multiple wavelength illumination | Stanley Stokowski, Mehdi Vaez-Iravani | 2005-10-18 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6956644 | Systems and methods for a wafer inspection system using multiple angles and multiple wavelength illumination | Stanley Stokowski, Mehdi Vaez-Iravani | 2005-10-18 |