Issued Patents 2004
Showing 1–13 of 13 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6829559 | Methods and systems for determining a presence of macro and micro defects on a specimen | Gary Bultman, Ady Levy, Kyle Brown, Dan Wack, John Fielden | 2004-12-07 |
| 6818459 | Methods and systems for determining a presence of macro defects and overlay of a specimen | Dan Wack, Ady Levy, Kyle Brown, Gary Bultman, John Fielden | 2004-11-16 |
| 6812045 | Methods and systems for determining a characteristic of a specimen prior to, during, or subsequent to ion implantation | Ady Levy, Kyle Brown, Gary Bultman, Dan Wack, John Fielden | 2004-11-02 |
| 6806951 | Methods and systems for determining at least one characteristic of defects on at least two sides of a specimen | Dan Wack, Ady Levy, Kyle Brown, Rodney Smedt, Gary Bultman +1 more | 2004-10-19 |
| 6804003 | System for analyzing surface characteristics with self-calibrating capability | Haiming Wang, Patrick M. Maxton, Kenneth C. Johnson | 2004-10-12 |
| 6782337 | Methods and systems for determining a critical dimension an a presence of defects on a specimen | Dan Wack, Ady Levy, Kyle Brown, Gary Bultman, John Fielden | 2004-08-24 |
| 6753528 | System for MEMS inspection and characterization | Guoheng Zhao | 2004-06-22 |
| 6734968 | System for analyzing surface characteristics with self-calibrating capability | Haiming Wang, Patrick M. Maxton, Kenneth C. Johnson | 2004-05-11 |
| 6721052 | Systems for measuring periodic structures | Guoheng Zhao, Kenneth P. Gross, Rodney Smedt | 2004-04-13 |
| 6710876 | Metrology system using optical phase | Guoheng Zhao, Ian Smith, Mehdi Vaez-Iravani | 2004-03-23 |
| 6707540 | In-situ metalization monitoring using eddy current and optical measurements | Kurt Lehman, Shing Lee, Walter H. Johnson, John Fielden, Guoheng Zhao | 2004-03-16 |
| 6694284 | Methods and systems for determining at least four properties of a specimen | Ady Levy, Kyle Brown, Gary Bultman, Dan Wack, John Fielden | 2004-02-17 |
| 6673637 | Methods and systems for determining a presence of macro defects and overlay of a specimen | Dan Wack, Ady Levy, Kyle Brown, Gary Bultman, John Fielden | 2004-01-06 |