Issued Patents 2004
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6787773 | Film thickness measurement using electron-beam induced x-ray microanalysis | — | 2004-09-07 |
| 6782164 | Thermally wavelength tunable laser having selectively activated gratings | David A. G. Deacon | 2004-08-24 |
| 6707540 | In-situ metalization monitoring using eddy current and optical measurements | Kurt Lehman, Walter H. Johnson, John Fielden, Guoheng Zhao, Mehrdad Nikoonahad | 2004-03-16 |