Issued Patents 2004
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6815959 | Systems and methods for measuring properties of conductive layers | Torsten Borchers, Daniel Griffing, Andrei Danet, George Erskine | 2004-11-09 |
| 6707540 | In-situ metalization monitoring using eddy current and optical measurements | Kurt Lehman, Shing Lee, John Fielden, Guoheng Zhao, Mehrdad Nikoonahad | 2004-03-16 |