Issued Patents 2004
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6834213 | Process control based upon a metrology delay | Thomas J. Sonderman, Jin Wang, Elfido Coss, Jr. | 2004-12-21 |
| 6778873 | Identifying a cause of a fault based on a process controller output | Jin Wang, Elfido Coss, Jr., Brian K. Cusson, Alexander J. Pasadyn, Michael L. Miller +1 more | 2004-08-17 |
| 6740534 | Determination of a process flow based upon fault detection analysis | Ernest D. Adams, III, Matthew A. Purdy, Gregory A. Cherry, Eric O. Green, Elfido Coss, Jr. +2 more | 2004-05-25 |