Issued Patents 2004
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6834211 | Adjusting a trace data rate based upon a tool state | Elfido Coss, Jr. | 2004-12-21 |
| 6800562 | Method of controlling wafer charging effects due to manufacturing processes | Thomas J. Sonderman | 2004-10-05 |
| 6778873 | Identifying a cause of a fault based on a process controller output | Jin Wang, Elfido Coss, Jr., Alexander J. Pasadyn, Michael L. Miller, Naomi M. Jenkins +1 more | 2004-08-17 |
| 6766214 | Adjusting a sampling rate based on state estimation results | Jin Wang | 2004-07-20 |
| 6740534 | Determination of a process flow based upon fault detection analysis | Ernest D. Adams, III, Matthew A. Purdy, Gregory A. Cherry, Eric O. Green, Elfido Coss, Jr. +2 more | 2004-05-25 |