Issued Patents 2003
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6636064 | Dual probe test structures for semiconductor integrated circuits | Akella V. S. Satya, David L. Adler, Neil Richardson, Kurt H. Weiner | 2003-10-21 |
| 6633174 | Stepper type test structures and methods for inspection of semiconductor integrated circuits | Akella V. S. Satya, David L. Adler, Neil Richardson, Gustavo A. Pinto | 2003-10-14 |
| 6627884 | Simultaneous flooding and inspection for charge control in an electron beam inspection machine | Mark A. McCord, Jun Pei, Neil Richardson | 2003-09-30 |
| 6566885 | Multiple directional scans of test structures on semiconductor integrated circuits | Gustavo A. Pinto, Brian C. Leslie, David L. Adler, Akella V. S. Satya, Robert Long | 2003-05-20 |
| 6532905 | CFB with controllable in-bed heat exchanger | Felix Belin, Mikhail Maryamchik, Sundara M. Kavidass, Donald L. Wietzke | 2003-03-18 |
| 6528818 | Test structures and methods for inspection of semiconductor integrated circuits | Akella V. S. Satya, Gustavo A. Pinto, David L. Adler, Robert Long, Neil Richardson +2 more | 2003-03-04 |
| 6524873 | Continuous movement scans of test structures on semiconductor integrated circuits | Akella V. S. Satya, David L. Adler, Bin-Ming Benjamin Tsai, Neil Richardson | 2003-02-25 |