Issued Patents 2003
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6636064 | Dual probe test structures for semiconductor integrated circuits | David L. Adler, Neil Richardson, Kurt H. Weiner, David J. Walker | 2003-10-21 |
| 6633174 | Stepper type test structures and methods for inspection of semiconductor integrated circuits | David L. Adler, Neil Richardson, Gustavo A. Pinto, David J. Walker | 2003-10-14 |
| 6576923 | Inspectable buried test structures and methods for inspecting the same | Robert Long, Lynda C. Mantalas, Gustavo A. Pinto, Neil Richardson | 2003-06-10 |
| 6566885 | Multiple directional scans of test structures on semiconductor integrated circuits | Gustavo A. Pinto, Brian C. Leslie, David L. Adler, Robert Long, David J. Walker | 2003-05-20 |
| 6528818 | Test structures and methods for inspection of semiconductor integrated circuits | Gustavo A. Pinto, David L. Adler, Robert Long, Neil Richardson, Kurt H. Weiner +2 more | 2003-03-04 |
| 6524873 | Continuous movement scans of test structures on semiconductor integrated circuits | David L. Adler, Bin-Ming Benjamin Tsai, Neil Richardson, David J. Walker | 2003-02-25 |
| 6509197 | Inspectable buried test structures and methods for inspecting the same | Robert Long, Lynda C. Mantalas, Gustavo A. Pinto, Neil Richardson | 2003-01-21 |