Issued Patents 2003
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6633174 | Stepper type test structures and methods for inspection of semiconductor integrated circuits | Akella V. S. Satya, David L. Adler, Neil Richardson, David J. Walker | 2003-10-14 |
| 6576923 | Inspectable buried test structures and methods for inspecting the same | Akella V. S. Satya, Robert Long, Lynda C. Mantalas, Neil Richardson | 2003-06-10 |
| 6566885 | Multiple directional scans of test structures on semiconductor integrated circuits | Brian C. Leslie, David L. Adler, Akella V. S. Satya, Robert Long, David J. Walker | 2003-05-20 |
| 6528818 | Test structures and methods for inspection of semiconductor integrated circuits | Akella V. S. Satya, David L. Adler, Robert Long, Neil Richardson, Kurt H. Weiner +2 more | 2003-03-04 |
| 6509197 | Inspectable buried test structures and methods for inspecting the same | Akella V. S. Satya, Robert Long, Lynda C. Mantalas, Neil Richardson | 2003-01-21 |