Issued Patents 2003
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6642726 | Apparatus and methods for reliable and efficient detection of voltage contrast defects | Gaurav Verma, Isabella Talley Lewis | 2003-11-04 |
| 6636064 | Dual probe test structures for semiconductor integrated circuits | Akella V. S. Satya, David L. Adler, Neil Richardson, David J. Walker | 2003-10-21 |
| 6528818 | Test structures and methods for inspection of semiconductor integrated circuits | Akella V. S. Satya, Gustavo A. Pinto, David L. Adler, Robert Long, Neil Richardson +2 more | 2003-03-04 |