RT

Randhir P. S. Thakur

Micron: 30 patents #11 of 829Top 2%
MT Mattson Technology: 1 patents #11 of 39Top 30%
SG Steag Rtp Systems Gmbh: 1 patents #1 of 4Top 25%
📍 Fremont, CA: #2 of 758 inventorsTop 1%
🗺 California: #13 of 26,763 inventorsTop 1%
Overall (2002): #68 of 266,432Top 1%
32
Patents 2002

Issued Patents 2002

Showing 1–25 of 32 patents

Patent #TitleCo-InventorsDate
6486020 High pressure reoxidation/anneal of high dielectric constant materials Scott DeBoer 2002-11-26
6479854 Capacitor/antifuse structure having a barrier-layer electrode and improved barrier layer Garry Mercaldi, Michael Nuttall 2002-11-12
6475927 Method of forming a semiconductor device 2002-11-05
6469388 Structure for contact formation using a silicon-germanium alloy 2002-10-22
6462394 Device configured to avoid threshold voltage shift in a dielectric film Ravi Iyer, Howard E. Rhodes 2002-10-08
6461982 Methods for forming a dielectric film Scott DeBoer 2002-10-08
6458645 Capacitor having tantalum oxynitride film and method for making same Scott DeBoer, Husam N. Al-Shareef, Dan Gealy 2002-10-01
6452678 Reflectance method for evaluating the surface characteristics of opaque materials Michael Nuttall, J. Brett Rolfson, Robert Burke 2002-09-17
6451661 DRAM capacitor formulation using a double-sided electrode Scott J. DeBoer, Husam N. Al-Shareef 2002-09-17
6448133 Method to form a DRAM capacitor using low temperature reoxidation Brett Rolfson 2002-09-10
6441466 Method and apparatus for reducing fixed charge in semiconductor device layers Ravi Iyer, Howard E. Rhodes 2002-08-27
6436847 Methods to form electronic devices 2002-08-20
6436818 Semiconductor structure having a doped conductive layer Yongjun Jeff Hu, Pai-Hung Pan, Er-Xuan Ping, Scott DeBoer 2002-08-20
6432841 Method for forming a dielectric Li Li, Richard C. Hawthorne 2002-08-13
6426306 Barrier layer fabrication methods Scott DeBoer 2002-07-30
6423649 Method and apparatus for stabilizing high pressure oxidation of a semiconductor device Daniel Gealy, Dave Chapek, Scott DeBoer, Husam N. Al-Shareef 2002-07-23
6417928 Reflectance method for evaluating the surface characteristics of opaque materials Michael Nuttall, J. Brett Rolfson, Robert Burke 2002-07-09
6404005 Methods of forming capacitors and related integrated circuitry Scott DeBoer, Klaus Schuegraf 2002-06-11
6403923 System for controlling the temperature of a reflective substrate during rapid heating Sing-Pin Tay, Yao Zhi Hu, Arnon Gat 2002-06-11
6400552 Capacitor with conductively doped Si-Ge alloy electrode Husam N. Al-Shareef, Scott DeBoer, F. Daniel Gealy 2002-06-04
6399459 Double layer electrode and barrier system on hemispherical grain silicon for use with high dielectric constant materials and methods for fabricating the same Husam N. Al-Shareef, Scott DeBoer 2002-06-04
6392284 Capacitor/antifuse structure having a barrier-layer electrode and improved barrier layer Garry Mercaldi, Michael Nuttall 2002-05-21
6383875 Method of forming a transistor gate 2002-05-07
6380103 Rapid thermal etch and rapid thermal oxidation Fernando Gonzalez 2002-04-30
6368887 Method of monitoring a process of manufacturing a semiconductor wafer including hemispherical grain polysilicon Tyler Lowrey, Klaus Schuegraf 2002-04-09