Issued Patents 2002
Showing 1–11 of 11 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6445051 | Method and system for providing contacts with greater tolerance for misalignment in a flash memory | Mark S. Chang, Hao Fang, King Wai Kelwin Ko, Michael K. Templeton, Lu You +1 more | 2002-09-03 |
| 6423612 | Method of fabricating a shallow trench isolation structure with reduced topography | Wenge Yang, Fei Wang | 2002-07-23 |
| 6420240 | Method for reducing the step height of shallow trench isolation structures | Wenge Yang, Hao Fang | 2002-07-16 |
| 6410458 | Method and system for eliminating voids in a semiconductor device | Lu You, Dawn Hopper | 2002-06-25 |
| 6410949 | Flash memory device with monitor structure for monitoring second gate over-etch | Kent Kuohua Chang, Hao Fang | 2002-06-25 |
| 6380029 | Method of forming ono stacked films and DCS tungsten silicide gate to improve polycide gate performance for flash memory devices | Kent Kuohua Chang, Kenneth Wo-Wai Au | 2002-04-30 |
| 6376309 | Method for reduced gate aspect ratio to improve gap-fill after spacer etch | Kent Kuohua Chang, Hao Fang, Lu You | 2002-04-23 |
| 6365945 | Submicron semiconductor device having a self-aligned channel stop region and a method for fabricating the semiconductor device using a trim and etch | Michael K. Templeton, Masaaki Higashitani | 2002-04-02 |
| 6362049 | High yield performance semiconductor process flow for NAND flash memory products | Salvatore F. Cagnina, Hao Fang, Kent Kuohua Chang, Masaatzi Higashitani | 2002-03-26 |
| 6355522 | Effect of doped amorphous Si thickness on better poly 1 contact resistance performance for nand type flash memory devices | Kent Kuohua Chang, Yuesong He | 2002-03-12 |
| 6350627 | Interlevel dielectric thickness monitor for complex semiconductor chips | Tho Le La, Hao Fang | 2002-02-26 |