Issued Patents 1997
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5689457 | Semiconductor Memory | Katsuhiro Shimohigashi, Hiroo Masuda, Kunihiko Ikuzaki | 1997-11-18 |
| 5640098 | IC fault analysis system having charged particle beam tester | Hironobu Niijima, Akira Goishi, Masayuki Kurihara, Toshimichi Iwai | 1997-06-17 |
| 5619312 | Developing device with developer-supplying mechanism | Shintarou Hatano, Hiroshi Kawahito, Yoshiki Ichikawa, Fumito Mizoguti, Masahiro Tsuji +5 more | 1997-04-08 |
| 5604371 | Semiconductor device with an insulation film having an end covered by a conductive film | Koji Kimura, Yuichi Nakashima | 1997-02-18 |
| 5592100 | Method for detecting an IC defect using charged particle beam | Soichi Shida, Hironobu Niijima | 1997-01-07 |