Issued Patents 1997
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5640098 | IC fault analysis system having charged particle beam tester | Hironobu Niijima, Hiroshi Kawamoto, Akira Goishi, Masayuki Kurihara | 1997-06-17 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5640098 | IC fault analysis system having charged particle beam tester | Hironobu Niijima, Hiroshi Kawamoto, Akira Goishi, Masayuki Kurihara | 1997-06-17 |