Issued Patents 1997
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5592100 | Method for detecting an IC defect using charged particle beam | Hiroshi Kawamoto, Hironobu Niijima | 1997-01-07 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5592100 | Method for detecting an IC defect using charged particle beam | Hiroshi Kawamoto, Hironobu Niijima | 1997-01-07 |