Issued Patents All Time
Showing 101–125 of 137 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9496361 | Selectively deposited metal gates and method of manufacturing thereof | Yu-Cheng Tung | 2016-11-15 |
| 9494873 | Asymmetry compensation method used in lithography overlay process | Teng-Chin Kuo, Yuan-Chi Pai, Chun-Chi Yu | 2016-11-15 |
| 9496176 | Semiconductor device | Yu-Cheng Tung | 2016-11-15 |
| 9490341 | Semiconductor device having metal gate and method for manufacturing semiconductor device having metal gate | Chih-Wei Yang, Yu-Cheng Tung | 2016-11-08 |
| 9490217 | Overlay marks and semiconductor process using the overlay marks | Chia-Ching Lin, Chia-Hung Wang, Sho-Shen Lee | 2016-11-08 |
| 9482964 | Overlap mark set and method for selecting recipe of measuring overlap error | Chia-Chang Hsu, Yi-Ting Chen, Teng-Chin Kuo, Chun-Chi Yu | 2016-11-01 |
| 9470987 | Overlay mask | Che-Yi Lin, Yi-Jing Wang, Chia-Hsun Tseng | 2016-10-18 |
| 9466564 | Semiconductor device and method for fabricating the same | Chih-Wei Yang, Chih-Sen Huang, Yu-Cheng Tung | 2016-10-11 |
| 9455135 | Method for fabricating semiconductor device | Chia-Lin Lu, Chun-Lung Chen, Kun-Yuan Liao, Feng-Yi Chang, Chieh-Te Chen | 2016-09-27 |
| 9448471 | Photo-mask and method of manufacturing semiconductor structures by using the same | Yu-Cheng Tung, Teng-Chin Kuo, Yuan-Chi Pai, Chun-Chi Yu | 2016-09-20 |
| 9410902 | Overlay measurement method | Yi-Jing Wang | 2016-08-09 |
| 9406521 | Semiconductor device and method for fabricating the same | Yu-Cheng Tung | 2016-08-02 |
| 9400435 | Method of correcting overlay error | Chia-Chang Hsu, Teng-Chin Kuo, Chia-Hung Wang, Tuan-Yen Yu, Yuan-Chi Pai +1 more | 2016-07-26 |
| 9397008 | Semiconductor device and manufacturing method of conductive structure in semiconductor device | Yu-Cheng Tung | 2016-07-19 |
| 9385220 | Semiconductor device having fin structure that includes dummy fins | — | 2016-07-05 |
| 9385236 | Fin shaped semiconductor device structures having tipped end shape and method for fabricating the same | Chien-Ying Sun, Ming-Shing Chen, Yu-Cheng Tung, Chih-Wei Yang | 2016-07-05 |
| 9378973 | Method of using sidewall image transfer process to form fin-shaped structures | Yu-Cheng Tung | 2016-06-28 |
| 9373505 | Mark segmentation method and method for manufacturing a semiconductor structure applying the same | Yu-Ying Huang, Jen-Hsiu Li, Mei-Chen Chen, Ya-Ling Chen, Yi-Jing Wang +1 more | 2016-06-21 |
| 9349822 | Semiconductor device and method for fabricating the same | Chih-Wei Yang, Yu-Feng Liu, Jian-Cun Ke, Chia-Fu Hsu, Ssu-I Fu +11 more | 2016-05-24 |
| 9349607 | Method of forming line pattern | Yu-Cheng Tung | 2016-05-24 |
| 9337260 | Shallow trench isolation in bulk substrate | Po-Chao Tsao, Chia-Jui Liang, Jia-Rong Wu | 2016-05-10 |
| 9324570 | Method of manufacturing semiconductor device | — | 2016-04-26 |
| 9318389 | Integrated circuit having plural transistors with work function metal gate structures | Chih-Wei Yang, Yu-Feng Liu, Jian-Cun Ke, Chia-Fu Hsu, Yu-Ru Yang | 2016-04-19 |
| 9305884 | Overlay mark and method for forming the same | Teng-Chin Kuo, Yi-Ting Chen | 2016-04-05 |
| 9304389 | Photomask and fabrication method thereof | Sho-Shen Lee, Wen-Liang Huang, Chang-Mao Wang, Kai-Lin Chuang | 2016-04-05 |