Issued Patents All Time
Showing 1–25 of 26 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12078527 | Differential COTDR distributed acoustic sensing device and method based on heterogeneous double-sideband chirped-pulses | Junfeng Jiang, Tiegen Liu, Zhe Ma, Shuang Wang, Zhenyang Ding +3 more | 2024-09-03 |
| 11996441 | Semiconductor device for high voltage applications | Bong Woong Mun | 2024-05-28 |
| 11654568 | 3D measurement model and spatial calibration method based on 1D displacement sensor | Wei Liu, Bing Liang, Mengde Zhou, Yang Zhang, Di Feng +3 more | 2023-05-23 |
| 11473992 | Residual pressure measurement system for Fabry-Perot cavity of optical MEMS pressure sensor and method thereof | Shuang Wang, Junfeng Jiang, Tiegen Liu, Xue Mei WANG, Mengnan XIAO +1 more | 2022-10-18 |
| 11289896 | System and method for autonomous monitoring and active defense of lightning | Rubin Jiang, Yuming DU, Jiaming Jia | 2022-03-29 |
| 11205069 | Hybrid cornea and pupil tracking | Robin Sharma, Javier San Agustin Lopez, Karol Constantine Hatzilias, Sebastian Sztuk, Jixu Chen | 2021-12-21 |
| 11181400 | Fiber Bragg Grating demodulation device capable of supressing fluctuations at variable ambient temperature and demodulation method thereof | Junfeng Jiang, Tiegen Liu, Jinling Yan, Shuang Wang, Xuezhi Zhang +3 more | 2021-11-23 |
| 10508938 | Fiber optical fabry-perot flow test device and test method with local bending diversion structure | Tiegen Liu, Junfeng Jiang, Huijia Yang, Shuang Wang, Weihang Zhang | 2019-12-17 |
| 10365088 | Distributed measuring device and method for simultaneously measuring strain and temperature based on optical frequency domain reflection | Zhenyang Ding, Di Yang, Tiegen Liu, Yang Du, Zhexi XU +1 more | 2019-07-30 |
| 10365126 | Distributed optical fiber disturbance positioning system based on the asymmetric dual Mach-Zehnder interference, and positioning method thereof | Tiegen Liu, Junfeng Jiang, Chunyu Ma, Tianjiao Chai, Chang He +2 more | 2019-07-30 |
| 10057522 | Image sensor and method and apparatus for removing sunspot of the same | Xianqing Guo, Jingjun Fu | 2018-08-21 |
| 9871132 | Extended drain metal-oxide-semiconductor transistor | Xiaoping Wang, Francis Benistant, Li Cao | 2018-01-16 |
| 9847361 | Pixel cell, image sensor, and manufacturing method | Caiting Zhang, Jingjun Fu, Wenge Hu | 2017-12-19 |
| 9673084 | Isolation scheme for high voltage device | Francis Benistant, Ming-Shuan Li, Namchil Mun, Shiang Yang Ong, Purakh Raj Verma | 2017-06-06 |
| 9322740 | Distributed disturbance sensing device and the related demodulation method based on polarization sensitive optical frequency domain reflectometry | Tiegen Liu, Zhenyang Ding, Junfeng Jiang, Dingjie Li | 2016-04-26 |
| 9074957 | High stable fiber fabry-perot pressure sensor with glue-free packing and its fabrication method | Junfeng Jiang, Tiegen Liu, Jinde Yin, Yu-Cheng Liu | 2015-07-07 |
| 8958075 | Swing-style and high signal-to-noise ratio demodulation devices and corresponding demodulation method for the measurement of low coherence interference displacement | Tiegen Liu, Junfeng Jiang, Jinde Yin, Shaohua Wang | 2015-02-17 |
| 8951833 | Defect free deep trench method for semiconductor chip | — | 2015-02-10 |
| 8934100 | Multi-band multiplexing intra-cavity gas sensing system and method | Tiegen Liu, Junfeng Jiang, Xiao Liang | 2015-01-13 |
| 7659965 | High throughput wafer stage design for optical lithography exposure apparatus | — | 2010-02-09 |
| 7489982 | Method and software for conducting efficient lithography WPH / lost time analysis in semiconductor manufacturing | Dean Liu | 2009-02-10 |
| 6824931 | Verification photomask | Ching-Ming Chen, Chin-Chuan Hsieh | 2004-11-30 |
| 6664177 | Dielectric ARC scheme to improve photo window in dual damascene process | Kwang-Ming Lin, Chung-Hung Lu, Szu-An Wu, Ya-Li Tai | 2003-12-16 |
| 6602642 | Optical proximity correction verification mask | Chin-Chuan Hsieh, Ching-Ming Chen | 2003-08-05 |
| 6602641 | Wafer's zero-layer and alignment mark print without mask when using scanner | — | 2003-08-05 |