Issued Patents All Time
Showing 701–725 of 865 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7395467 | Remove signal from TAP selection circuitry to multiplexer control circuitry | — | 2008-07-01 |
| 7395471 | Connection of auxiliary circuitry to tap and instruction register controls | — | 2008-07-01 |
| 7389456 | IC with linking module in series with TAP circuitry | Baher Haroun, Brian J. Lasher, Anjali Kinra | 2008-06-17 |
| 7368304 | Fabricating die with separate test pads selectively coupled to cores | Richard L. Antley | 2008-05-06 |
| 7362120 | Method and apparatus for die testing on wafer | — | 2008-04-22 |
| 7362093 | IC selectively connecting logic and bypass conductors between opposing pads | — | 2008-04-22 |
| 7356745 | IC with parallel scan paths and compare circuitry | — | 2008-04-08 |
| 7355430 | Parallel scan distributors and collectors and process of testing integrated circuits | — | 2008-04-08 |
| 7346821 | IC with JTAG port, linking module, and off-chip TAP interface | — | 2008-03-18 |
| 7343537 | IC with protocol selection memory coupled to serial scan path | — | 2008-03-11 |
| 7327162 | Operations with logical states from a four voltage level signal | — | 2008-02-05 |
| 7328387 | Addressable tap domain selection circuit with selectable ⅗ pin interface | — | 2008-02-05 |
| 7310756 | JTAG state machines with respective enable input and select input | — | 2007-12-18 |
| 7308629 | Addressable tap domain selection circuit with TDI/TDO external terminal | — | 2007-12-11 |
| 7286623 | Plural circuit selection using role reversing control inputs | — | 2007-10-23 |
| 7284170 | JTAG circuit transferring data between devices on TMS terminals | — | 2007-10-16 |
| 7281183 | Data retaining boundary scan cell | — | 2007-10-09 |
| 7269769 | AC propagation testing preventing sampling test data at Capture-DR state | — | 2007-09-11 |
| 7257749 | Probeless testing of pad buffers on wafer | — | 2007-08-14 |
| 7256601 | First and second scan distributors, collectors, controllers, and multiplexers | — | 2007-08-14 |
| 7242211 | Hierarchical link instruction register core/embedded core wrapper enable signals | — | 2007-07-10 |
| 7230447 | Fault tolerant selection of die on wafer | — | 2007-06-12 |
| 7231566 | Initializing an output memory circuit of a scan cell | — | 2007-06-12 |
| 7219283 | IC with TAP, STP and lock out controlled output buffer | — | 2007-05-15 |
| 7219284 | Decode logic selecting IC scan path parts | Jayashree Saxena | 2007-05-15 |