Issued Patents All Time
Showing 1–20 of 20 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10809295 | Die testing using top surface test pads | Lee D. Whetsel | 2020-10-20 |
| 10690717 | Enable input buffer coupling enable pad, functional circuitry, test circuit | Lee D. Whetsel | 2020-06-23 |
| 10281522 | Test circuitry coupling test pad to functional core input pad | Lee D. Whetsel | 2019-05-07 |
| 9472478 | Die testing using top surface test pads | Lee D. Whetsel | 2016-10-18 |
| 9245812 | Die with separate functional input, test out, enable input buffers | Lee D. Whetsel | 2016-01-26 |
| 8941109 | Test output buffer functional output input, test output, enable input | Lee D. Whetsel | 2015-01-27 |
| 8742415 | Test circuitry coupled to embedded circuit input/output unconnected to pads | Lee D. Whetsel | 2014-06-03 |
| 8466464 | Test and enable circuitry connected between embedded die circuits | Lee D. Whetsel | 2013-06-18 |
| 8230284 | Integrated circuit having electrically isolatable test circuitry | Lee D. Whetsel | 2012-07-24 |
| 8168970 | Die having embedded circuitry with test and test enable circuitry | Lee D. Whetsel | 2012-05-01 |
| 8055962 | Testing IC functional and test circuitry having separate input/output pads | Lee D. Whetsel | 2011-11-08 |
| 7956357 | Test pads coupled with leads unconnected with die pads | Lee D. Whetsel | 2011-06-07 |
| 7823038 | Connecting analog response to separate strobed comparator input on IC | Lee D. Whetsel | 2010-10-26 |
| 7587648 | Integrated circuit having electrically isolatable test circuitry | Lee D. Whetsel | 2009-09-08 |
| 7569853 | Test pads on leads unconnected with die pads | Lee D. Whetsel | 2009-08-04 |
| 7418643 | Integrated circuit having electrically isolatable test circuitry | Lee D. Whetsel | 2008-08-26 |
| 7368304 | Fabricating die with separate test pads selectively coupled to cores | Lee D. Whetsel | 2008-05-06 |
| 7124341 | Integrated circuit having electrically isolatable test circuitry | Lee D. Whetsel | 2006-10-17 |
| 7056752 | Fabricating a die with test enable circuits between embedded cores | Lee D. Whetsel | 2006-06-06 |
| 6590225 | Die testing using top surface test pads | Lee D. Whetsel | 2003-07-08 |