Issued Patents All Time
Showing 25 most recent of 44 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11617558 | Multimodal strain sensor and method | Kang Hyuck LEE, Yizhou Zhang | 2023-04-04 |
| 11448959 | Lignin based laser lithography process for fabricating 3D graphene electrode and method | Wenli Zhang, Yongjiu LEI | 2022-09-20 |
| 11031620 | Osmotic energy conversion with MXene lamellar membrane-based system and method | Seunghyun Hong, Peng Wang | 2021-06-08 |
| 10964822 | Single material electronic device and method of producing such an electronic device | Fwzah Hamud Alshammari | 2021-03-30 |
| 10903019 | Compositions and methods of making metal-organic frameworks with redox-active centers | Arijit MALLICK, Bilal Anjum Ahmed, Osama Shekhah, Mohamed Eddaoudi | 2021-01-26 |
| 10096352 | Ferroelectric capacitor with improved fatigue and breakdown properties | Mohd Adnan Khan, Ihab N. Odeh, Mahmoud N. Almadhoun | 2018-10-09 |
| 10068630 | Non-volatile ferroelectric memory cells with multilevel operation | Ji Hoon Park, Mohd Adnan Khan, Ihab N. Odeh | 2018-09-04 |
| 10068771 | System and method for mitigating oxide growth in a gate dielectric | Malcolm J. Bevan, Haowen Bu, Hiroaki Niimi | 2018-09-04 |
| 9976913 | Thermal history devices, systems for thermal history detection, and methods for thermal history detection | Jesus Alfonso Caraveo Frescas | 2018-05-22 |
| 9892927 | System and method for mitigating oxide growth in a gate dielectric | Malcolm J. Bevan, Haowen Bu, Hiroaki Niimi | 2018-02-13 |
| 9779946 | System and method for mitigating oxide growth in a gate dielectric | Malcolm J. Bevan, Haowen Bu, Hiroaki Niimi | 2017-10-03 |
| 9576804 | System and method for mitigating oxide growth in a gate dielectric | Malcolm J. Bevan, Haowen Bu, Hiroaki Niimi | 2017-02-21 |
| 9543322 | Methods for producing a thin film ferroelectric device using a two-step temperature process on an organic polymeric ferroelectric precursor material stacked between two conductive materials | Ji Hoon Park, Ihab N. Odeh, Mohd Adnan Khan | 2017-01-10 |
| 9396951 | System and method for mitigating oxide growth in a gate dielectric | Malcolm J. Bevan, Haowen Bu, Hiroaki Niimi | 2016-07-19 |
| 9368355 | System and method for mitigating oxide growth in a gate dielectric | Malcolm J. Bevan, Haowen Bu, Hiroaki Niimi | 2016-06-14 |
| 9337046 | System and method for mitigating oxide growth in a gate dielectric | Malcolm J. Bevan, Haowen Bu, Hiroaki Niimi | 2016-05-10 |
| 9337044 | System and method for mitigating oxide growth in a gate dielectric | Malcolm J. Bevan, Haowen Bu, Hiroaki Niimi | 2016-05-10 |
| 9305706 | Fractional order capacitor | Mahmoud N. Almadhoun, Amro M. Elshurafa, Khaled Nabil Salama | 2016-04-05 |
| 9177806 | System and method for mitigating oxide growth in a gate dielectric | Malcolm J. Bevan, Haowen Bu, Hiroaki Niimi | 2015-11-03 |
| 8994014 | Ferroelectric devices, interconnects, and methods of manufacture thereof | Unnat S. Bhansali, Mohd Adnan Khan, Moussa Saleh, Ihab N. Odeh | 2015-03-31 |
| 8878341 | Graphene-based composite materials, method of manufacture and applications thereof | Mahmoud N. Almadhoun, Unnat S. Bhansali, Prince Xavier, Ihab N. Odeh | 2014-11-04 |
| 8802519 | Work function adjustment with the implant of lanthanides | Manfred Ramin, Michael F. Pas | 2014-08-12 |
| 8409943 | Work function adjustment with the implant of lanthanides | Manfred Ramin, Michael F. Pas | 2013-04-02 |
| 8304333 | Method of forming a high-k gate dielectric layer | Manfred Ramin, Michael F. Pas | 2012-11-06 |
| 8008216 | Nitrogen profile in high-K dielectrics using ultrathin disposable capping layers | Manuel Lopez, JR. | 2011-08-30 |