| 7024031 |
System and method for inspection using off-angle lighting |
Ramiro Castellanos-Nolasco, Sanjeev Mathur, John Thornell, Thomas Casey Carrington, Hak Chuah Sim +1 more |
2006-04-04 |
| 6902340 |
Binder construction for easy insertion and removal of spine label |
Jack B. Harrison, Richard Joyner, Brian King, Frank Ciotoli |
2005-06-07 |
| 6765666 |
System and method for inspecting bumped wafers |
Clyde Maxwell Guest, Younes Chtioui, Rajiv Roy, Weerakiat Wahawisan, Thomas Casey Carrington |
2004-07-20 |
| 6761498 |
Binder construction for easy insertion and removal of spine label |
Jack B. Harrison, Richard Joyner, Brian King |
2004-07-13 |
| 6292580 |
Efficient illumination system for wire bonders |
Sreenivasan K. Koduri, Joe D. Woodall, Lance Cole Wright |
2001-09-18 |
| 6292260 |
System and method of optically inspecting surface structures on an object |
Youling Lin, Max Guest, George C. Epp |
2001-09-18 |
| 6252981 |
System and method for selection of a reference die |
Clyde Maxwell Guest, Rajiv Roy |
2001-06-26 |
| 6128034 |
High speed lead inspection system |
Michael C. Zemek |
2000-10-03 |
| 6042247 |
Efficient hybrid illuminator |
Sreenivasan K. Koduri, Joe D. Woodall, Lance Cole Wright |
2000-03-28 |
| 5987161 |
Apparatus and method for identifying defective objects |
Dennis Lee Doane, Rajiv Roy, Joe D. Woodall, Thomas J. Doty |
1999-11-16 |
| 5956134 |
Inspection system and method for leads of semiconductor devices |
Rajiv Roy, Michael D. Glucksman, Weerakiat Wahawisan, Paul Harris Hasten, George C. Epp |
1999-09-21 |
| 5414458 |
Semiconductor device lead inspection system |
Joseph F. Borchard, Robert Henry Clunn, James R. Maunder, Walter E. Marrable, Jr. |
1995-05-09 |
| 5402505 |
Semiconductor device lead inspection system |
Rajiv Roy |
1995-03-28 |
| 5220400 |
Container inspection system |
Charles H. Anderson |
1993-06-15 |