Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7024031 | System and method for inspection using off-angle lighting | Ramiro Castellanos-Nolasco, Sanjeev Mathur, John Thornell, Hak Chuah Sim, Clyde Maxwell Guest +1 more | 2006-04-04 |
| 6765666 | System and method for inspecting bumped wafers | Clyde Maxwell Guest, Younes Chtioui, Rajiv Roy, Charles K. Harris, Weerakiat Wahawisan | 2004-07-20 |