Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10553504 | Inspection of substrates | Gurvinder Singh, Wu Y. Han, Chetan Suresh, Wayne Fitzgerald | 2020-02-04 |
| 10466179 | Semiconductor device inspection of metallic discontinuities | Gurvinder Singh, Wu Y. Han, Chetan Suresh, Wayne Fitzgerald | 2019-11-05 |
| 10024804 | System and method of characterizing micro-fabrication processes | Steven Knauber, Jatinder Dhaliwal, Justin Miller, Michael A. Grant, Kenneth Durden | 2018-07-17 |
| 9658169 | System and method of characterizing micro-fabrication processes | Steven Knauber, Jatinder Dhaliwal, Justin Miller, Michael A. Grant, Kenneth Durden | 2017-05-23 |
| 7024031 | System and method for inspection using off-angle lighting | Ramiro Castellanos-Nolasco, Sanjeev Mathur, Thomas Casey Carrington, Hak Chuah Sim, Clyde Maxwell Guest +1 more | 2006-04-04 |
| 6744913 | System and method for locating image features | Clyde Maxwell Guest | 2004-06-01 |