Issued Patents All Time
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11531279 | System and method for optimizing a lithography exposure process | Elvino da Silveira, Keith Frank Best, Jian Lu, Xin Song, J. Casey Donaher +1 more | 2022-12-20 |
| 11315832 | Wafer singulation process control | — | 2022-04-26 |
| 11126096 | System and method for optimizing a lithography exposure process | Elvino da Silveira, Keith Frank Best, Jian Lu, Xin Song, J. Casey Donaher +1 more | 2021-09-21 |
| 10553504 | Inspection of substrates | Gurvinder Singh, Wu Y. Han, John Thornell, Chetan Suresh | 2020-02-04 |
| 10528961 | System and method for estimating a move using object measurements | Thomas A. Tama, Jr., Christopher J. Ramsey | 2020-01-07 |
| 10466179 | Semiconductor device inspection of metallic discontinuities | Gurvinder Singh, Wu Y. Han, John Thornell, Chetan Suresh | 2019-11-05 |
| 5888050 | Precision high pressure control assembly | Kenneth Joseph James, Brian J. Waibel | 1999-03-30 |