XS

Xin Song

SS Sk Hynix Memory Solutions: 6 patents #16 of 60Top 30%
OI Onto Innovation: 3 patents #4 of 69Top 6%
AP Avago Technologies General Ip (Singapore) Pte.: 1 patents #883 of 2,004Top 45%
II Inspex Incorporated: 1 patents #7 of 13Top 55%
LD Link—A—Media Devices: 1 patents #22 of 26Top 85%
📍 San Jose, CA: #4,970 of 32,062 inventorsTop 20%
🗺 California: #46,935 of 386,348 inventorsTop 15%
Overall (All Time): #370,390 of 4,157,543Top 9%
13
Patents All Time

Issued Patents All Time

Showing 1–13 of 13 patents

Patent #TitleCo-InventorsDate
12111355 Semiconductor substrate yield prediction based on spectra data from multiple substrate dies Jian Lu 2024-10-08
11531279 System and method for optimizing a lithography exposure process Elvino da Silveira, Keith Frank Best, Wayne Fitzgerald, Jian Lu, J. Casey Donaher +1 more 2022-12-20
11126096 System and method for optimizing a lithography exposure process Elvino da Silveira, Keith Frank Best, Wayne Fitzgerald, Jian Lu, J. Casey Donaher +1 more 2021-09-21
9235346 Dynamic map pre-fetching for improved sequential reads of a solid-state media Leonid Baryudin, Zhiqing Zhang, Yun Shun Tan, Lin Chen 2016-01-12
9043688 Error data generation and application for disk drive applications Kai Keung Chan, Jason Bellorado, Kwok W. Yeung 2015-05-26
8935309 Generation of constrained pseudo-random binary sequences (PRBS) Kai Keung Chan 2015-01-13
8862971 Inter-track interference (ITI) correlation and cancellation for disk drive applications Kai Keung Chan, Kwok W. Yeung, Xianfeng Rui 2014-10-14
8804264 Method to apply user data for read channel training and adaptation in hard disk drive applications Kwok W. Yeung 2014-08-12
8631311 Data recovery using existing reconfigurable read channel hardware Kai Keung Chan, Yu Kou, Wing Hui 2014-01-14
8489971 Hardware implementation scheme to adapt coefficients for data dependent noise prediction and soft output viterbi algorithm Kai Keung Chan, Kin Man Ng, Jason Bellorado 2013-07-16
8185810 Low power viterbi trace back architecture Kwok Alfred Yeung, Paul K. Lai 2012-05-22
6842866 Method and system for analyzing bitmap test data Stewart Hitelman, Chin-Jung Hsu 2005-01-11
6643006 Method and system for reviewing a semiconductor wafer using at least one defect sampling condition Chin-Jung Hsu, Arnold Cheng 2003-11-04