Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6643006 | Method and system for reviewing a semiconductor wafer using at least one defect sampling condition | Chin-Jung Hsu, Xin Song | 2003-11-04 |
| 6028664 | Method and system for establishing a common reference point on a semiconductor wafer inspected by two or more scanning mechanisms | Chin-Jung Hsu, James Seng Ju Ni | 2000-02-22 |