Issued Patents All Time
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7046837 | System and method for locating irregular edges in image data | Chu-Yin Chang | 2006-05-16 |
| 7024031 | System and method for inspection using off-angle lighting | Ramiro Castellanos-Nolasco, Sanjeev Mathur, John Thornell, Thomas Casey Carrington, Hak Chuah Sim +1 more | 2006-04-04 |
| 6765666 | System and method for inspecting bumped wafers | Younes Chtioui, Rajiv Roy, Charles K. Harris, Weerakiat Wahawisan, Thomas Casey Carrington | 2004-07-20 |
| 6744913 | System and method for locating image features | John Thornell | 2004-06-01 |
| 6459807 | System and method for locating irregular edges in image data | Chu-Yin Chang | 2002-10-01 |
| 6252981 | System and method for selection of a reference die | Rajiv Roy, Charles K. Harris | 2001-06-26 |
| 5838434 | Semiconductor device lead calibration unit | David A. Skramsted, Dennis M. Botkins | 1998-11-17 |