Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6765666 | System and method for inspecting bumped wafers | Clyde Maxwell Guest, Younes Chtioui, Rajiv Roy, Charles K. Harris, Thomas Casey Carrington | 2004-07-20 |
| 6118540 | Method and apparatus for inspecting a workpiece | Rajiv Roy, Michael C. Zemek | 2000-09-12 |
| 5956134 | Inspection system and method for leads of semiconductor devices | Rajiv Roy, Michael D. Glucksman, Paul Harris Hasten, Charles K. Harris, George C. Epp | 1999-09-21 |
| 5777886 | Programmable lead conditioner | Michael D. Glucksman, Troy D. Moore, Paul Harris Hasten, Dennis M. Botkin, James E. Loveless +3 more | 1998-07-07 |
| 5745593 | Method and system for inspecting integrated circuit lead burrs | Rajiv Roy | 1998-04-28 |