Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10024804 | System and method of characterizing micro-fabrication processes | John Thornell, Steven Knauber, Jatinder Dhaliwal, Justin Miller, Michael A. Grant | 2018-07-17 |
| 9658169 | System and method of characterizing micro-fabrication processes | John Thornell, Steven Knauber, Jatinder Dhaliwal, Justin Miller, Michael A. Grant | 2017-05-23 |
| 7835566 | All surface data for use in substrate inspection | David E. Reich, Randall Shay | 2010-11-16 |
| 7593565 | All surface data for use in substrate inspection | David E. Reich, Randall Shay | 2009-09-22 |