YL

Youling Lin

TI Texas Instruments: 8 patents #1,843 of 12,488Top 15%
RT Rudolph Technologies: 4 patents #15 of 136Top 15%
TU Texas Tech University: 3 patents #9 of 93Top 10%
EL Electroglas: 1 patents #11 of 34Top 35%
Overall (All Time): #241,622 of 4,157,543Top 6%
19
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
7359577 Differential method for layer-to-layer registration Yan Wang 2008-04-15
7206442 Optical inspection method utilizing ultraviolet light David W. Herod, Kathleen Hennessey 2007-04-17
7039228 System and method for three-dimensional surface inspection Ramakrishna Pattikonda 2006-05-02
6864971 System and method for performing optical inspection utilizing diffracted light A. Kathleen Hennessey, Yongqiang Liu, Yonghang Fu, Masami Yamashita, Ichiro Shimomura 2005-03-08
6847443 System and method for multi-wavelength, narrow-bandwidth detection of surface defects David W. Herod 2005-01-25
6813376 System and method for detecting defects on a structure-bearing surface using optical inspection Kathleen Hennessey, Yongqiang Liu, Veera V. S. Khaja, Yonghang Fu 2004-11-02
6487307 System and method of optically inspecting structures on an object Kathleen Hennessey 2002-11-26
6483938 System and method for classifying an anomaly A. Kathleen Hennessey, Rajasekar Reddy, C. Rinn Cleavelin, Howard V. Hastings, II, Pinar Kinikoglu +1 more 2002-11-19
6292260 System and method of optically inspecting surface structures on an object Charles K. Harris, Max Guest, George C. Epp 2001-09-18
6292582 Method and system for identifying defects in a semiconductor A. Kathleen Hennessey, Ramachandra R. Katragadda, Ramakrishna Pattikonda, Rajasekar Reddy, C. Rinn Cleavelin +2 more 2001-09-18
6246787 System and method for knowledgebase generation and management A. Kathleen Hennessey, Rajasekar Reddy, C. Rinn Cleavelin, Howard V. Hastings, II, Pinar Kinokoglu +1 more 2001-06-12
6246788 System and method of optically inspecting manufactured devices Ramakrishna Pattikonda, Kathleen Hennessey 2001-06-12
6205239 System and method for circuit repair A. Kathleen Hennessey, Ramakrishna Pattikonda, Rajasekar Reddy, Veera S. Khaja, C. Rinn Cleavelin 2001-03-20
6091846 Method and system for anomaly detection A. Kathleen Hennessey, Ramakrishna Pattikonda, Veera S. Khaja, Rajasekar Reddy 2000-07-18
6014461 Apparatus and method for automatic knowlege-based object identification Audrey Kathleen Hennessey, Veera V. S. Khaja, Ramakrishna Pattikonda, Rajasekar Reddy, Huitian Lu +1 more 2000-01-11
5703969 System and method for recognizing visual indicia A. Kathleen Hennessey, Howard V. Hastings, II, Jerome Lovelace, Ning Chang 1997-12-30
5696835 Apparatus and method for aligning and measuring misregistration A. Kathleen Hennessey, Wan S. Wong, C. Rinn Cleavelin, Stephen J. DeMoor, Kwang Soo Hahn 1997-12-09
5553168 System and method for recognizing visual indicia A. Kathleen Hennessey, Howard V. Hastings, II, Jerome Lovelace, Ning Chang 1996-09-03
5515453 Apparatus and method for image processing in symbolic space A. Kathleen Hennessey, Kwang Soo Hahn 1996-05-07