YF

Yonghang Fu

RT Rudolph Technologies: 2 patents #41 of 136Top 35%
Overall (All Time): #1,575,997 of 4,157,543Top 40%
3
Patents All Time

Issued Patents All Time

Showing 1–3 of 3 patents

Patent #TitleCo-InventorsDate
7539583 Method and system for defect detection Yongqiang Liu, Michael J. Darwin 2009-05-26
6864971 System and method for performing optical inspection utilizing diffracted light Youling Lin, A. Kathleen Hennessey, Yongqiang Liu, Masami Yamashita, Ichiro Shimomura 2005-03-08
6813376 System and method for detecting defects on a structure-bearing surface using optical inspection Kathleen Hennessey, Youling Lin, Yongqiang Liu, Veera V. S. Khaja 2004-11-02