| 11863122 |
System and method for testing photosensitive device degradation |
Michael D. Irwin, Kamil Mielczarek |
2024-01-02 |
| 11387779 |
System and method for testing photosensitive device degradation |
Michael D. Irwin, Kamil Mielczarek |
2022-07-12 |
| 10797641 |
System and method for testing photosensitive device degradation |
Michael D. Irwin, Kamil Mielczarek |
2020-10-06 |
| 9985583 |
System and method for testing photosensitive device degradation |
Michael D. Irwin, Kamil Mielczarek |
2018-05-29 |
| 9831829 |
System and method for testing photosensitive device degradation |
Michael D. Irwin, Kamil Mielczarek |
2017-11-28 |
| 6477685 |
Method and apparatus for yield and failure analysis in the manufacturing of semiconductors |
— |
2002-11-05 |
| 5703969 |
System and method for recognizing visual indicia |
A. Kathleen Hennessey, Youling Lin, Howard V. Hastings, II, Ning Chang |
1997-12-30 |
| 5553168 |
System and method for recognizing visual indicia |
A. Kathleen Hennessey, Youling Lin, Howard V. Hastings, II, Ning Chang |
1996-09-03 |