Issued Patents All Time
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11863122 | System and method for testing photosensitive device degradation | Michael D. Irwin, Kamil Mielczarek | 2024-01-02 |
| 11387779 | System and method for testing photosensitive device degradation | Michael D. Irwin, Kamil Mielczarek | 2022-07-12 |
| 10797641 | System and method for testing photosensitive device degradation | Michael D. Irwin, Kamil Mielczarek | 2020-10-06 |
| 9985583 | System and method for testing photosensitive device degradation | Michael D. Irwin, Kamil Mielczarek | 2018-05-29 |
| 9831829 | System and method for testing photosensitive device degradation | Michael D. Irwin, Kamil Mielczarek | 2017-11-28 |
| 6477685 | Method and apparatus for yield and failure analysis in the manufacturing of semiconductors | — | 2002-11-05 |
| 5703969 | System and method for recognizing visual indicia | A. Kathleen Hennessey, Youling Lin, Howard V. Hastings, II, Ning Chang | 1997-12-30 |
| 5553168 | System and method for recognizing visual indicia | A. Kathleen Hennessey, Youling Lin, Howard V. Hastings, II, Ning Chang | 1996-09-03 |