| 10109597 |
Crack deflector structure for improving semiconductor device robustness against saw-induced damage |
Jeffrey Alan West, Thomas D. Bonifield |
2018-10-23 |
| 8912076 |
Crack deflector structure for improving semiconductor device robustness against saw-induced damage |
Jeffrey Alan West, Thomas D. Bonifield |
2014-12-16 |
| 8309957 |
Replacement of scribeline padframe with saw-friendly design |
Jeffrey Alan West, Gregory B. Shinn |
2012-11-13 |
| 8273523 |
By-die-exposure for patterning of holes in edge die |
Shangting Detweiler, Chris Atkinson, Richard L. Guldi |
2012-09-25 |
| 7727885 |
Reduction of punch-thru defects in damascene processing |
Phillip D. Matz, Sopa Chevacharoenkul, Ching-Te Lin, Anand J. Reddy, Kenneth Newton +1 more |
2010-06-01 |
| 7598507 |
Adjustable lithography blocking device and method |
Richard L. Guldi, Keith Melcher |
2009-10-06 |
| 7212607 |
X-ray confocal defect detection systems and methods |
Satyavolu Srinivas Papa Rao, Richard L. Guldi |
2007-05-01 |
| 6834117 |
X-ray defect detection in integrated circuit metallization |
Satyavolu Papa Rao, Richard L. Guldi |
2004-12-21 |
| 6579798 |
Processes for chemical-mechanical polishing of a semiconductor wafer |
Mona Eissa, Chad Kaneshige, Vincent C. Korthuis, Barry Lanier, Satyavolu Papa Rao |
2003-06-17 |
| 5571339 |
Hydrogen passivated heteroepitaxial III-V photovoltaic devices grown on lattice-mismatched substrates, and process |
Steven A. Ringel, Richard W. Hoffman |
1996-11-05 |