Issued Patents All Time
Showing 1–25 of 54 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12354857 | System and method for residual gas analysis | — | 2025-07-08 |
| 12296428 | Chemical mechanical polishing apparatus and method | Jun Liu, Chia-Hsien Chou | 2025-05-13 |
| 12265301 | Electronic device with backlight module | Chin-Lung Ting, Ming-Hui Chu, Fang-Ho LIN, Chia-Lun Chen | 2025-04-01 |
| 12183593 | Manufacturing method for manufacturing a package structure | Chia-Pin Chen, Chia Sheng Tien, Wan-Ting Chiu, Chi-Long Tsai, Cyuan-Hong Shih | 2024-12-31 |
| 12176193 | System and method for residual gas analysis | — | 2024-12-24 |
| 12062166 | Method and system for diagnosing a semiconductor wafer | Jun Liu | 2024-08-13 |
| 12047222 | AI-assisted communication circuit optimization | Po-Yu Chen, Chi-Tsan Chen, Chao Wang | 2024-07-23 |
| 11841622 | Method and apparatus for diffraction-based overlay measurement | Hung-Chih Hsieh | 2023-12-12 |
| 11835820 | Display device with backlight module | Chin-Lung Ting, Ming-Hui Chu, Fang-Ho LIN, Chia-Lun Chen | 2023-12-05 |
| 11791141 | System and method for residual gas analysis | — | 2023-10-17 |
| 11656391 | Aperture design and methods thereof | Hung-Chih Hsieh, Kai-Chiang Wu, Kai-Hsiung Chen, Po-Chung Cheng, Chih-Ming Ke | 2023-05-23 |
| 11487157 | Display device | Chin-Lung Ting, Ming-Hui Chu, Fang-Ho LIN, Chia-Lun Chen | 2022-11-01 |
| 11449984 | Method and system for diagnosing a semiconductor wafer | Jun Liu | 2022-09-20 |
| 11275314 | Method and apparatus for diffraction-based overlay measurement | Hung-Chih Hsieh | 2022-03-15 |
| 11251753 | Envelope tracking supply modulator with zero peaking and associated envelope tracking calibration method and system | Chen-Yen Ho, Chien-Wei Kuan | 2022-02-15 |
| 11243475 | Overlay measurement structures with variable width/pitch for measuring overlay errors | — | 2022-02-08 |
| 11163102 | Backlight module and light guide plate thereof and display device using the same | Chao-Fang Chung, Chen-Chia WU, Chao-Chun Huang, Ming-Hui Chu | 2021-11-02 |
| 11158040 | Method for identifying robot arm responsible for wafer scratch | — | 2021-10-26 |
| 11119416 | Method for forming semiconductor structure and overlay error estimation | Che-Yuan Sun, He Fan, Yen-Hung Chen, Kai-Chun Lin | 2021-09-14 |
| 11073726 | Display device having reduced size and improved illumination | Chin-Lung Ting, Ming-Hui Chu, Fang-Ho LIN, Chia-Lun Chen | 2021-07-27 |
| 10990023 | Method and apparatus for diffraction-based overlay measurement | Hung-Chih Hsieh | 2021-04-27 |
| 10983005 | Spectroscopic overlay metrology | Kai-Chiang Wu, Hung-Chih Hsieh, Kai-Hsiung Chen, Chih-Ming Ke | 2021-04-20 |
| 10935578 | Electronic apparatus, voltage detector and voltage detection method thereof | Yu-Ho Lin | 2021-03-02 |
| 10795268 | Method and apparatus for measuring overlay errors using overlay measurement patterns | — | 2020-10-06 |
| 10755405 | Method and system for diagnosing a semiconductor wafer | Jun Liu | 2020-08-25 |