Issued Patents All Time
Showing 25 most recent of 56 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12326397 | In-situ apparatus for detecting abnormality in process tube | Yu-Jen Yang, Chung-Pin Chou, Kai-Lin Chuang, Yan Chen, Sheng-Ching Kao | 2025-06-10 |
| 12296428 | Chemical mechanical polishing apparatus and method | Yen-Liang Chen, Chia-Hsien Chou | 2025-05-13 |
| 12272576 | Apparatus and methods for determining fluid dynamics of liquid film on wafer surface | Chung-Pin Chou, Kai-Lin Chuang, Yan Chen, Jui Kuo LAI | 2025-04-08 |
| 12190036 | Method and system for semiconductor wafer defect review | Chung-Pin Chou, Chun-Wen Wang, Meng Ku Chi, Yan Chen | 2025-01-07 |
| 12191175 | Nozzle having real time inspection functions | Kai-Lin Chuang, Tsung-Chi Chen, Pei-Jung Chang, Chun-Wei Huang | 2025-01-07 |
| 12119273 | System and method for high speed inspection of semiconductor substrates | Sheng-He Huang, Chung-Pin Chou, Shiue-Ming GUO, Hsuan-Chia KAO, Yan Chen +1 more | 2024-10-15 |
| 12087611 | Semiconductor processing tool and methods of operation | Chung-Pin Chou, Kai-Lin Chuang, Sheng-Wen Huang, Yan Chen | 2024-09-10 |
| 12062166 | Method and system for diagnosing a semiconductor wafer | Yen-Liang Chen | 2024-08-13 |
| 11935722 | Machine learning on wafer defect review | Chung-Pin Chou, Sheng-Wen Huang | 2024-03-19 |
| 11816411 | Method and system for semiconductor wafer defect review | Chung-Pin Chou, Chun-Wen Wang, Meng Ku Chi, Yan Chen | 2023-11-14 |
| 11764094 | Semiconductor processing tool and methods of operation | Chung-Pin Chou, Kai-Lin Chuang, Sheng-Wen Huang, Yan Chen | 2023-09-19 |
| 11749571 | System and method for high speed inspection of semiconductor substrates | Sheng-He Huang, Chung-Pin Chou, Shiue-Ming GUO, Hsuan-Chia KAO, Yan Chen +1 more | 2023-09-05 |
| 11668566 | Laser level | Muhammad Bahauddin KHAN, Kun CHANG, Wei-Chieh Chen | 2023-06-06 |
| 11668565 | Laser level | Muhammad Bahauddin KHAN, Kun CHANG, Wei-Chieh Chen | 2023-06-06 |
| 11514731 | Method and system for remote vehicle diagnostics | Zhijian Chen | 2022-11-29 |
| 11475721 | Method for performing vehicle remote diagnosis and related devices | Zhijian Chen | 2022-10-18 |
| 11475448 | Maintenance plant management method, system and data management server | Xin Liu, Rijun Xiao | 2022-10-18 |
| 11449984 | Method and system for diagnosing a semiconductor wafer | Yen-Liang Chen | 2022-09-20 |
| 11449837 | Maintenance equipment management method, system and data management server | Xin Liu, Rijun Xiao | 2022-09-20 |
| 11435181 | Laser level | Muhammad Bahauddin KHAN, Kun CHANG, Wei-Chieh Chen | 2022-09-06 |
| 11424101 | Machine learning on wafer defect review | Chung-Pin Chou, Sheng-Wen Huang | 2022-08-23 |
| 11355370 | Nozzle having real time inspection functions | Kai-Lin Chuang, Tsung-Chi Chen, Pei-Jung Chang, Chun-Wei Huang | 2022-06-07 |
| 11353505 | Differential clock cross point detection circuit and detection method | Mingyuan Xu, Liang Li, Xiaofeng Shen, Jianan Wang, Dongbing Fu +3 more | 2022-06-07 |
| 11288638 | Device management method, device management server and computer readable storage medium | Rijun Xiao | 2022-03-29 |
| 11222788 | Methods of enhancing surface topography on a substrate for inspection | Han-Wen Liao, Chun-Chih Lin | 2022-01-11 |