Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12190036 | Method and system for semiconductor wafer defect review | Chung-Pin Chou, Chun-Wen Wang, Yan Chen, Jun Liu | 2025-01-07 |
| 11816411 | Method and system for semiconductor wafer defect review | Chung-Pin Chou, Chun-Wen Wang, Yan Chen, Jun Liu | 2023-11-14 |