Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12326397 | In-situ apparatus for detecting abnormality in process tube | Yu-Jen Yang, Chung-Pin Chou, Kai-Lin Chuang, Yan Chen, Jun Liu | 2025-06-10 |
| 12119273 | System and method for high speed inspection of semiconductor substrates | Sheng-He Huang, Chung-Pin Chou, Shiue-Ming GUO, Hsuan-Chia KAO, Yan Chen +1 more | 2024-10-15 |
| 11749571 | System and method for high speed inspection of semiconductor substrates | Sheng-He Huang, Chung-Pin Chou, Shiue-Ming GUO, Hsuan-Chia KAO, Yan Chen +1 more | 2023-09-05 |