Issued Patents All Time
Showing 1–25 of 60 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12431194 | Resistive random access memory unit with one-way conduction characteristic and fabricating method thereof | Chrong-Jung Lin, Yu-Cheng Lin, Yao-Hung Huang | 2025-09-30 |
| 12426517 | Resistive memory device with protrusion covered with resistance changing element and method for manufacturing the same | Yu-Der Chih, Wen-Zhang Lin, Yun-Sheng Chen, Jonathan Tsung-Yung Chang, Chrong-Jung Lin +2 more | 2025-09-23 |
| 12424279 | Memory cell including programmable resistors with transistor components | Yu-Der Chih, Jonathan Tsung-Yung Chang, Yun-Sheng Chen, Maybe Chen, Wen-Zhang Lin +2 more | 2025-09-23 |
| 12399432 | Semiconductor fabrication apparatus and method of using the same | Yu-Der Chih, May-Be Chen, Chrong-Jung Lin, Burn Jeng Lin, Bo-Yu Lin | 2025-08-26 |
| 12347504 | One-time-programmable memory devices | Chrong-Jung Lin, Li Wang | 2025-07-01 |
| 12340839 | Memory device and system | Yu-Der Chih, Yun-Sheng Chen, Jonathan Tsung-Yung Chang, Hsin-Yuan Yu, Chrong-Jung Lin | 2025-06-24 |
| 12262545 | Three-dimensional resistive random access memory structure | Chrong-Jung Lin, Yao-Hung Huang | 2025-03-25 |
| 12249662 | Semiconductor device, manufacturing method thereof, and detecting method using the same | Chrong-Jung Lin, Burn Jeng Lin, Shi-Jiun WANG | 2025-03-11 |
| 12211949 | Semiconductor detector | Chrong-Jung Lin, Burn Jeng Lin, Shi-Jiun WANG | 2025-01-28 |
| 12142537 | Defect measurement method | Burn Jeng Lin, Chrong-Jung Lin, Yi-Pei Tsai | 2024-11-12 |
| 12051466 | Memory cell including programmable resistors with transistor components | Yu-Der Chih, Jonathan Tsung-Yung Chang, Yun-Sheng Chen, Maybe Chen, Wen-Zhang Lin +2 more | 2024-07-30 |
| 12041860 | Resistive memory device and method for manufacturing with protrusion of electrode | Yu-Der Chih, Wen-Zhang Lin, Yun-Sheng Chen, Jonathan Tsung-Yung Chang, Chrong-Jung Lin +2 more | 2024-07-16 |
| 12040028 | Low voltage one-time-programmable memory and array thereof | Chrong-Jung Lin, Yao-Hung Huang | 2024-07-16 |
| 12009177 | Detection using semiconductor detector | Chrong-Jung Lin, Burn Jeng Lin, Chien-Ping Wang, Shao-Hua Wang, Chun-Lin Chang +1 more | 2024-06-11 |
| 11943936 | Semiconductor device and method of manufacturing the same | Yu-Der Chih, May-Be Chen, Yun-Sheng Chen, Jonathan Tsung-Yung Chang, Wen-Zhang Lin +3 more | 2024-03-26 |
| 11824133 | Detection using semiconductor detector | Chrong-Jung Lin, Burn Jeng Lin, Shi-Jiun WANG | 2023-11-21 |
| 11695082 | Non-volatile memory cell and non-volatile memory | Jiun Shiung Wu, Chrong-Jung Lin | 2023-07-04 |
| 11653503 | Semiconductor structure with data storage structure and method for manufacturing the same | Woan-Yun HSIAO, Huang-Kui Chen, Tzong-Sheng Chang, Chrong-Jung Lin | 2023-05-16 |
| 11646079 | Memory cell including programmable resistors with transistor components | Yu-Der Chih, Maybe Chen, Yun-Sheng Chen, Wen-Zhang Lin, Jonathan Tsung-Yung Chang +2 more | 2023-05-09 |
| 11335609 | Micro detector | Burn Jeng Lin, Chrong-Jung Lin, Yi-Pei Tsai | 2022-05-17 |
| 11043601 | Non-volatile memory cell and non-volatile memory | Jiun Shiung Wu, Chrong-Jung Lin | 2021-06-22 |
| 10763305 | Semiconductor structure with data storage structure | Woan-Yun HSIAO, Huang-Kui Chen, Tzong-Sheng Chang, Chrong-Jung Lin | 2020-09-01 |
| 10276726 | Non-volatile memory cell and non-volatile memory | Jiun Shiung Wu, Chrong-Jung Lin | 2019-04-30 |
| 10269437 | Non-volatile memory device and operation method of the same | Chrong-Jung Lin | 2019-04-23 |
| 10090360 | Method of manufacturing a semiconductor structure including a plurality of trenches | Woan-Yun HSIAO, Chrong-Jung Lin, Huang-Kui Chen, Tzong-Sheng Chang | 2018-10-02 |