Issued Patents All Time
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12009177 | Detection using semiconductor detector | Ya-Chin King, Chrong-Jung Lin, Burn Jeng Lin, Shao-Hua Wang, Chun-Lin Chang +1 more | 2024-06-11 |
| 11306711 | Miniature cooling system | Yung Ting, Sheuan-Perng Lin, Chien-Hsiang Wu, Jun Chen | 2022-04-19 |
| 9726713 | Testing method and testing system for semiconductor element | Tzung-Te Chen, Chun-Fan Dai, Han-Kuei Fu, Pei-Ting Chou | 2017-08-08 |
| 9557368 | Method of measuring thermal electric characteristics of semiconductor device | Tzung-Te Chen, Pei-Ting Chou | 2017-01-31 |
| 9523572 | Thin-film curvature measurement apparatus and method thereof | Tzung-Te Chen, Shang-Ping Ying, Yi-Keng Fu, Hsun-Chih Liu | 2016-12-20 |
| 9341669 | Testing apparatus | Tzung-Te Chen, Yen-Liang Liu, Chun-Fan Dai, Han-Kuei Fu, Pei-Ting Chou | 2016-05-17 |
| 9110125 | Method and apparatus for detecting relationship between thermal and electrical properties of semiconductor device | Tzung-Te Chen, Pei-Ting Chou, Chun-Fan Dai, Yi-Ping Peng | 2015-08-18 |
| 8773158 | Inspection method | Shih-Chun Yang, Tzung-Te Chen, An-Tse Lee, Sheng-Bang Huang | 2014-07-08 |