Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9726713 | Testing method and testing system for semiconductor element | Tzung-Te Chen, Chun-Fan Dai, Han-Kuei Fu, Chien-Ping Wang | 2017-08-08 |
| 9557368 | Method of measuring thermal electric characteristics of semiconductor device | Chien-Ping Wang, Tzung-Te Chen | 2017-01-31 |
| 9341669 | Testing apparatus | Chien-Ping Wang, Tzung-Te Chen, Yen-Liang Liu, Chun-Fan Dai, Han-Kuei Fu | 2016-05-17 |
| 9110125 | Method and apparatus for detecting relationship between thermal and electrical properties of semiconductor device | Chien-Ping Wang, Tzung-Te Chen, Chun-Fan Dai, Yi-Ping Peng | 2015-08-18 |