Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12142537 | Defect measurement method | Burn Jeng Lin, Chrong-Jung Lin, Ya-Chin King | 2024-11-12 |
| 11335609 | Micro detector | Burn Jeng Lin, Chrong-Jung Lin, Ya-Chin King | 2022-05-17 |