Issued Patents All Time
Showing 1–20 of 20 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12334373 | Apparatus and method for inspecting wafer carriers | Cheng-Kang Hu, Shou-Wen Kuo, Jiun-Rong Pai, Hsu-Shui Liu | 2025-06-17 |
| 11961770 | Automated inspection tool | Chia-Han Lin, Chien-Fa Lee, Hsu-Shui Liu, Jiun-Rong Pai, Surendra Kumar Soni +9 more | 2024-04-16 |
| 11929271 | Apparatus and method for inspecting wafer carriers | Cheng-Kang Hu, Shou-Wen Kuo, Jiun-Rong Pai, Hsu-Shui Liu | 2024-03-12 |
| 11842481 | Defect offset correction | Chien-Ko Liao, Ya Hsun Hsueh, Hsu-Shui Liu, Jiun-Rong Pai, Shou-Wen Kuo | 2023-12-12 |
| 11754989 | Semiconductor equipment management method, electronic device, and non-transitory computer readable storage medium | Sing-Tsung Li, Hsu-Shui Liu, Jiun-Rong Pai, Shou-Wen Kuo, Chien-Ko Liao | 2023-09-12 |
| 11651981 | Method and system for map-free inspection of semiconductor devices | Jiao-Rou Liao, Cheng-Kang Hu, Hsu-Shui Liu, Jiun-Rong Pai, Shou-Wen Kuo | 2023-05-16 |
| 11430108 | Defect offset correction | Chien-Ko Liao, Ya Hsun Hsueh, Hsu-Shui Liu, Jiun-Rong Pai, Shou-Wen Kuo | 2022-08-30 |
| 11171065 | Automated inspection tool | Chia-Han Lin, Chien-Fa Lee, Hsu-Shui Liu, Jiun-Rong Pai, Surendra Kumar Soni +9 more | 2021-11-09 |
| 11152238 | Semiconductor processing stage profiler jig | Cheng-Kang Hu, Hsu-Shui Liu, Jiun-Rong Pai, Shou-Wen Kuo, Cheng-Hung Chen | 2021-10-19 |
| 11120539 | Topological scanning method and system | Jiao-Rou Liao, Cheng-Kang Hu, Shou-Wen Kuo, Jiun-Rong Pai, Hsu-Shui Liu | 2021-09-14 |
| 10889097 | Wafer debonding system and method | Chang-Chen Tsao, Kuo-Liang Lu, Ru-Liang Lee, Yu-Hung Cheng, Yeur-Luen Tu +1 more | 2021-01-12 |
| 10876976 | Apparatus and method for substrate inspection | Bo-Han Shih, Hsu-Shui Liu, Jiun-Rong Pai, Shou-Wen Kuo | 2020-12-29 |
| 10872794 | Automatic in-line inspection system | Chien-Ko Liao, Hsu-Shui Liu, Jiun-Rong Pai, Shou-Wen Kuo, Ya Hsun Hsueh | 2020-12-22 |
| 10852704 | Semiconductor equipment management method, electronic device, and non-transitory computer readable storage medium | Sing-Tsung Li, Hsu-Shui Liu, Jiun-Rong Pai, Shou-Wen Kuo, Chien-Ko Liao | 2020-12-01 |
| 10839507 | Defect offset correction | Chien-Ko Liao, Ya Hsun Hsueh, Hsu-Shui Liu, Jiun-Rong Pai, Shou-Wen Kuo | 2020-11-17 |
| 10714364 | Apparatus and method for inspecting wafer carriers | Cheng-Kang Hu, Shou-Wen Kuo, Jiun-Rong Pai, Hsu-Shui Liu | 2020-07-14 |
| 10569520 | Wafer debonding system and method | Chang-Chen Tsao, Kuo-Liang Lu, Ru-Liang Lee, Yu-Hung Cheng, Yeur-Luen Tu +1 more | 2020-02-25 |
| 10490463 | Automated inspection tool | Chia-Han Lin, Chien-Fa Lee, Hsu-Shui Liu, Jiun-Rong Pai, Surendra Kumar Soni +9 more | 2019-11-26 |
| 10155369 | Wafer debonding system and method | Chang-Chen Tsao, Kuo-Liang Lu, Ru-Liang Lee, Yu-Hung Cheng, Yeur-Luen Tu +1 more | 2018-12-18 |
| 10018573 | Dual-function wafer handling apparatus | Ming-Han Tsai, Guan-Cyun Li, Yen-Ju Wei, Chiung-Min Lin, Yi-Ming Chen | 2018-07-10 |