CL

Chen-Ming Lee

TSMC: 101 patents #257 of 12,232Top 3%
CE Compal Electronics: 1 patents #443 of 873Top 55%
GU Global Unichip: 1 patents #121 of 210Top 60%
📍 Hechuandi, TW: #1 of 15 inventorsTop 7%
Overall (All Time): #13,799 of 4,157,543Top 1%
102
Patents All Time

Issued Patents All Time

Showing 51–75 of 102 patents

Patent #TitleCo-InventorsDate
11581193 Semiconductor device and a method for fabricating the same Fu-Kai Yang, Mei-Yun Wang 2023-02-14
11569364 Silicide backside contact Chen-Hung Tsai, Fu-Kai Yang, Mei-Yun Wang 2023-01-31
11532507 Semiconductor device and method Chun-Han Chen, I-Wen Wu, Fu-Kai Yang, Mei-Yun Wang, Chung-Ting Ko +2 more 2022-12-20
11532480 Methods of forming contact features in semiconductor devices Chen-Hung Tsai, Fu-Kai Yang, Mei-Yun Wang 2022-12-20
11532504 Low-resistance contact plugs and method forming same Shao-Ming Koh, Fu-Kai Yang 2022-12-20
11495606 FinFET having non-merging epitaxially grown source/drains Chun Po Chang, Fu-Kai Yang, Mei-Yun Wang, Wei-Yang Lee, Tzu-Hsiang Hsu 2022-11-08
11495494 Methods for reducing contact depth variation in semiconductor fabrication Yun Lee, Fu-Kai Yang, Yi-Jyun Huang, Sheng-Hsiung Wang, Mei-Yun Wang 2022-11-08
11489053 Semiconductor device and method Chun-Han Chen, Fu-Kai Yang, Mei-Yun Wang 2022-11-01
11450572 Semiconductor device and method Chun-Han Chen, Fu-Kai Yang, Mei-Yun Wang 2022-09-20
11444162 Backside contact with air spacer Wei-Yang Lee 2022-09-13
11398553 Source/drain features Ruei-Ping Lin, Kai-Di Tzeng, Wei-Yang Lee 2022-07-26
11387331 Source/drain contact structure Ting Fang, Chung-Hao Cai, Jui-Ping Lin, Chia-Hsien Yao, Fu-Kai Yang +1 more 2022-07-12
11374104 Methods of reducing capacitance in field-effect transistors Chun-Han Chen, Fu-Kai Yang, Mei-Yun Wang 2022-06-28
11362003 Prevention of contact bottom void in semiconductor fabrication Yun Lee, Chung-Ting Ko, Mei-Yun Wang, Fu-Kai Yang 2022-06-14
11349005 Silicide structures in transistors and methods of forming Kai-Di Tzeng, Fu-Kai Yang, Mei-Yun Wang 2022-05-31
11302802 Parasitic capacitance reduction Jia-Heng Wang, Chun-Han Chen, I-Wen Wu, Fu-Kai Yang, Mei-Yun Wang 2022-04-12
11289383 Semiconductor device and method Chien-Yuan Chen, Jui-Ping Lin, Fu-Kai Yang, Mei-Yun Wang 2022-03-29
11264383 Fin field effect transistor (FinFET) device structure with capping layer and method for forming the same Chun-Han Chen, Fu-Kai Yang, Mei-Yun Wang, Jr-Hung Li, Bo-Cyuan Lu 2022-03-01
11239309 Isolation features and methods of fabricating the same I-Wen Wu, Fu-Kai Yang, Mei-Yun Wang, Jr-Hung Li, Bo-Cyuan Lu 2022-02-01
11227950 Methods of forming air spacers in semiconductor devices Chao-Hsun Wang, Kuo-Yi Chao, Mei-Yun Wang, Pei-Yu Chou, Kuo-Ju Chen 2022-01-18
11222951 Epitaxial source/drain structure and method I-Wen Wu, Fu-Kai Yang, Mei-Yun Wang, Chun-An Lin, Wei-Yuan Lu +2 more 2022-01-11
11217492 Method for source/drain contact formation in semiconductor devices using common doping and common etching to n-type and p-type source/drains Shao-Ming Koh, I-Wen Wu, Fu-Kai Yang, Jia-Heng Wang, Mei-Yun Wang 2022-01-04
11145554 Method for source/drain contact formation in semiconductor devices Shao-Ming Koh, I-Wen Wu, Fu-Kai Yang, Jia-Heng Wang, Mei-Yun Wang 2021-10-12
11132031 Electronic device Che-Hsien Lin, Che-Hsien Chu, Ko-Yen Lu, Chun-Chieh Chen, Yi-Hung Chen +1 more 2021-09-28
11062945 Methods for reducing contact depth variation in semiconductor fabrication Yun Lee, Fu-Kai Yang, Yi-Jyun Huang, Sheng-Hsiung Wang, Mei-Yun Wang 2021-07-13